testing sheet in Chinese
Translation
Mobile
- 檢驗(yàn)單
- "test" in Chinese : n. 【動(dòng)物；動(dòng)物學(xué)】(軟體類的)介殼，甲殼；【植物；植 ...
- "sheet" in Chinese : n. 【航?！?1.繚繩；帆腳索。 2.〔pl.〕(船頭 ...
- "testing record sheet" in Chinese : 試驗(yàn)記錄表; 試驗(yàn)記錄卡
- "double loop-sheet testing machine" in Chinese : 雙卷層薄板試驗(yàn)機(jī)
- "sheet metal ductility testing instrument" in Chinese : 金屬板延性試驗(yàn)儀
- "testing" in Chinese : 測(cè)試系統(tǒng); 吃力的; 復(fù)合地層試井; 檢驗(yàn)的; 施測(cè); 試驗(yàn)的; 試驗(yàn)方法; ...
- "a sheet of" in Chinese : 成幅的薄片; 一張
- "on the sheet" in Chinese : 在紙上
- "sheet" in Chinese : n. 1.〔常 pl.〕被單；褥單。 2.裹尸布。 3.(懺悔者穿的)白衣； ...
- "sheet-in" in Chinese : 縮帖
- "laminating sheet to sheet" in Chinese : 單張紙覆膜
- "sheet erosion (sheet wash)" in Chinese : 片蝕
- "sheet lead starting sheet" in Chinese : 鉛板始極片
- "sheet piler; sheet stackers" in Chinese : 垛板機(jī)
- "sheet to sheet duplicator" in Chinese : 頁(yè)轉(zhuǎn)頁(yè)復(fù)制機(jī)
Examples
- To get the test sheets for us
還幫我們偷試卷 - To get the test sheets for us
還幫我們偷試卷 - Accomplishing the development of square four point probe instrument with the function of image manipulation for testing sheet resistance automatically
4完成具有圖像識(shí)別功能的全自動(dòng)四探針微區(qū)電阻率測(cè)試儀的研制。 - In this paper , the circuit used for testing sheet resistance is designed using single chip processor . additionally , we have expressed van der pauw function as a polynomial form through local and global reversal development by using the normalized polynomial match , being convenient not only for programming , but also for sheet resistance testing when using van der pauw and rymaszewski methods
本文還利用單片機(jī)系統(tǒng)設(shè)計(jì)了薄層電阻測(cè)試電路，對(duì)于程序中用到的范德堡隱函數(shù)，利用非線性反演和規(guī)范化擬合的方法推導(dǎo)出其多項(xiàng)式顯函數(shù)形式。這不僅給對(duì)我們編寫程序提供了方便，也為使用范德堡法和rymaszewski法測(cè)量薄層電阻提供了便利。 - At present , the problem in testing sheet resistance for micro - areas is that probes must be set up at the suitable locations by handwork . in order to know the wafer ' s impurity distributing , we need test many times , so will waste a lot of time . if the wafer ' s diameter would be 300mm , this problem will be more serious . in this paper , image analysis is introduced , through pre - processing and edge picking - up , the probe tips are recognized . then probe tips will be aligned respectively in two perpendicular directions through driving stepper motors . thus the distribution of sheet resistance for whole wafer is got by automatic testing and it offers information for detecting the impurity distribution and the diffusion uniformity
這樣，完成200mm ( 8時(shí))圓片雜質(zhì)的擴(kuò)散分布需要對(duì)許多圖形進(jìn)行測(cè)試，需要花費(fèi)很長(zhǎng)的時(shí)間，當(dāng)測(cè)試300mm硅片時(shí)問(wèn)題就更為突出。本文將圖象與視覺測(cè)量系統(tǒng)引入四探針測(cè)試系統(tǒng)中，對(duì)采集到的原始探針圖像進(jìn)行預(yù)處理、邊緣提取等操作，以便實(shí)現(xiàn)探針針尖的識(shí)別，然后由電機(jī)控制實(shí)現(xiàn)探針的自動(dòng)定位。這樣測(cè)試系統(tǒng)可以自動(dòng)獲得全片的薄層電阻分布，為超大規(guī)模集成電路檢測(cè)雜質(zhì)分布和擴(kuò)散的均勻性提供信息。
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